What raw data looks like
Here is a microstructure whose every pixel is known exactly (parents and twin lamellae, the same cast as part 3), and next to it, what a real scan of it would return. Two corruptions do almost all the damage in real data, and you control both.
Non-indexed points cluster at grain boundaries, where the interaction volume straddles two crystals and the pattern is two patterns superimposed, plus scratches, contamination and dust scattered anywhere. The software returns nothing, honestly. Mis-indexed speckle is subtler: the triplet vote from part 1 elects a wrong-but-confident orientation (pseudosymmetry, overlap, bad luck), sprinkling single pixels of a foreign orientation through otherwise clean grains. Both arrive exactly where the confidence index already warned you they would.
The cleanup machine
Vendors ship a stack of cleanup passes (grain dilation, grain CI standardisation, neighbour-orientation correlation), and they compose. The machine below runs the same logic in its plainest form: first fill each hole with the majority of its neighbours, then keep going: reassigning any pixel that disagrees with its neighbourhood. One slider, from "untouched" to "thoroughly laundered".
Go deeper: the real algorithms, by name
Grain dilation grows indexed grains into non-indexed space until the holes are gone: the fill stage above. Grain CI standardisation assigns every pixel in a grain the grain's best CI, so that a subsequent CI filter throws away isolated low-confidence points but keeps grains; it rewrites no orientations itself, but it decides what the next pass may rewrite. Neighbour orientation correlation reassigns pixels that disagree with most of their neighbours: the smoothing stage above, and the one that eats real features. Newer pattern-space methods (NPAR and its cousins) average raw patterns before indexing instead of editing orientations after: better behaved, same obligation to say so.
Every package logs none of this in the figure. The map that emerges carries no watermark saying "14% of these pixels are interpolation". That watermark is the caption's job, which is the whole point of this page.
What it does to your statistics
The picture is not the deliverable; the numbers are. Because this page knows the truth, it can plot what no experiment can: the actual error of every statistic, at every cleanup level. The curves below re-run part 3's grain count and twin fraction on the cleaned map, at every level of the slider, and compare against the known answer.
State every cleanup step and its parameters in the methods. Report the raw indexing rate. Keep a raw map in the supplement. Compute boundary and grain statistics only from measured pixels where feasible, and check that the conclusion survives at zero cleanup and at double your chosen level. If a result appears only after cleaning, it is a property of the cleaning.
Cleanup is validated by eye against expectations, which makes it a machine for confirming expectations. The nastiest failure mode is not noise surviving; it is a real, unexpected feature (a fine twin, a recrystallised nucleus, a second phase) being scrubbed because the algorithm, tuned until the map "looked right", counted it as noise. Watch the finest lamella in the demo above being eaten alive over the last few slider levels. Yours will be too.
Sources & further reading
- D. P. Field, “Recent advances in the application of orientation imaging,” Ultramicroscopy 67, 1 (1997): the confidence index and the standardisation logic built on it.
- F. J. Humphreys, “Grain and subgrain characterisation by electron backscatter diffraction,” J. Mater. Sci. 36, 3833 (2001): noise, thresholds, and defensible practice.
- V. Randle, “Electron backscattered diffraction: strategies for reliable data acquisition and processing,” Mater. Charact. 60, 913 (2009): acquisition and cleanup strategy, stated as strategy rather than default.
- I. Brough, P. S. Bate, F. J. Humphreys, “Optimising the angular resolution of EBSD,” Mater. Sci. Technol. 22, 1279 (2006): where the noise floor actually comes from.
- S. I. Wright, M. M. Nowell, S. P. Lindeman, P. P. Camus, M. De Graef, M. A. Jackson, “Introduction and comparison of new EBSD post-processing methodologies,” Ultramicroscopy 159, 81 (2015), NPAR and friends: cleaning patterns instead of orientations.
- G. Nolze, “Image distortions in SEM and their influences on EBSD measurements,” Ultramicroscopy 107, 172 (2007): the corruptions cleanup cannot fix.